Dr. Alex Dommann

Biography

Alex Dommann is a Professor Emeritus at the University of Bern, renowned for his extensive research in the fields of Medtech and X-Ray analytics. His long-standing interest lies in analyzing bio surface interactions and the properties of surfaces, interfaces, coatings, and thin films. Dommann’s research and teaching activities are predominantly focused on aspects of surface science and technology, particularly in surface functionalization and biointerface studies. His analytical work places a strong emphasis on novel X-ray based methods to investigate materials that range from amorphous to highly crystalline, employing non-invasive investigation techniques across various sample lengths. His expertise includes X-Ray Diffraction (XRD), High Resolution X-Ray Diffraction (HRXRD), Small Angle X-Ray Scattering (SAXS, USAXS, GISAXS), and Computer Tomography (CT), including Phase Contrast Computer Tomography (XPCI). His research also encompasses nanoparticles, nanocarrier systems made from lipids, and phase change materials, combined with the development of X-ray characterization techniques for surfaces and interfaces.

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