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Professor LeBeau develops scanning transmission electron microscopy techniques that connect atomic structure, chemistry, defects, interfaces, and material properties to various applications such as quantum computing, energy storage, power electronics, dielectrics, and optics. His research group focuses on making electron microscopy quantitative and reproducible while maintaining the creative elements of the scientific process. He earned a Bachelor of Science degree in materials science engineering from Rensselaer Polytechnic Institute in 2006 and a PhD in materials from the University of California, Santa Barbara, in 2010. He joined the Department of Materials Science and Engineering at North Carolina State University as a faculty member in January 2011 and became a visiting professor at MIT's DMSE in 2018. Professor LeBeau has published more than 90 papers and holds a patent.
Massachusetts Institute of Technology • Cambridge, MA
Visiting professor in the Department of Materials Science and Engineering.
North Carolina State University • Raleigh, NC
Faculty member in the Department of Materials Science and Engineering.