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Jennifer E. Michaels was born in Nashville, Tennessee, and grew up in Ashland, Kentucky. She graduated from Georgia Tech in 1976 with a bachelor’s degree in Electrical Engineering. After graduation, she joined Hanford Engineering Development Laboratory in Richland, Washington, where she began developing systems methods in ultrasonic evaluation. Her work led to graduate studies in Theoretical and Applied Mechanics at Cornell University, where she earned her M.S. and Ph.D. degrees in 1982 and 1984, respectively, and spent a year as an IBM Postdoctoral Fellow. In 1985, she joined the faculty at Georgia Tech and worked in industry as a co-founder of a startup company, serving as Manager of Systems Development at Panametrics, Inc., a world leader in the development and manufacture of automated ultrasonic inspection systems. Dr. Michaels’ industrial research career has primarily focused on ultrasonic wave propagation applied to nondestructive evaluation and structural health monitoring. She has made significant contributions related to ultrasonic sparse guided wave arrays, wavefield imaging, situ monitoring of structures, signal processing imaging methods, and automated inspection systems. Dr. Michaels regularly consults on industry projects related to ultrasonic nondestructive evaluation and automated systems.
Georgia Institute of Technology • Atlanta, GA, US
Served as Professor Emeritus focusing on ultrasonic nondestructive evaluation and structural health monitoring.
Related to advancements in ultrasonic inspection technologies.
Department of Computer Science: GRE scores are optional for Fall 2026.