Generate a tailored SOP for Dr. Kees Hagen. Improve your application with a focused, well-structured draft.
Kees Hagen is an associate professor at Delft University of Technology, focusing on the field of microscopy and lithography using charged particles. His research primarily involves the development of innovative electron and ion sources, with a current emphasis on focused electron-beam-induced processing (FEBIP) and resist-based electron beam lithography for the fabrication of structures ranging from 1 to 20 nm. Hagen has co-authored over 60 papers in peer-reviewed journals and conference proceedings, and has contributed to a book on electron-beam-induced nanometer-scale deposition. He holds a patent, demonstrating his commitment to advancing techniques in this specialized area. From 2000 to 2003, he was a member of the EuroFE coordination committee within an ESF network, reflecting his role in European collaborative research efforts. In 2006, Hagen organized the International Workshop on Electron-Beam-Induced Deposition in Delft, serving as the chairman of the International Steering Committee for FEPIP workshops. He is involved in teaching several courses including Introduction to Charged Particle Optics, Scanning Electron Microscopy, and others across the academic year.
Requirements apply generally across engineering and science master programs. Specific tracks like Architecture require a digital portfolio.