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Leeor Alon is an Associate Professor in the Department of Radiology at NYU Grossman School of Medicine. His research interests include developing methods for specific absorption rate (SAR) assessment related to cell phone safety, advancing magnetic resonance thermometry for temperature mapping, and exploring coil safety in MRI technology. Alon is particularly focused on improving safety standards for MRI coils, enhancing their performance, and ensuring patient safety in magnetic resonance imaging environments. He has contributed significantly to the field through various research projects and publications, emphasizing the integration of advanced imaging techniques to better understand and address safety concerns in medical applications.
Open Program in Biomedical Sciences (Vilcek Institute) covers departments like Biochemistry, Pathology, Neuroscience, Microbiology, etc.