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Nagarajan Raghavan obtained his Ph.D. in Microelectronics from Nanyang Technological University in 2012 and has a strong background in materials science and engineering. His academic journey includes obtaining a Master's degree in Advanced Materials Micro & Nano Systems and a Master of Engineering in Materials Science Engineering from the National University of Singapore. Raghavan has also served as a post-doctoral fellow at the Interuniversity Microelectronics Center (IMEC) in association with Katholieke Universiteit Leuven in Belgium. His primary research focuses on reliability-based design and prognostics for health management systems in engineering products and systems, specifically in the fields of robotics and electronics. He has been recognized with several awards, including the IEEE Electron Device Society PhD Student Fellowship Award and the IEEE Reliability Society Graduate Scholarship Award. Raghavan is an active member of the IEEE community and has served on various review committees for IEEE journals and conferences. He has authored and co-authored close to 100 international peer-reviewed publications and holds a patent related to the fabrication of resistive random-access memory (RRAM) devices. His work significantly contributes to the understanding and advancement of reliability in microelectronics.
This applies to PhD programs in Architecture and Sustainable Design (ASD), Engineering Product Development (EPD), Engineering Systems and Design (ESD), Information Systems Technology and Design (ISTD), Science, Mathematics and Technology (SMT), and Humanities, Arts and Social Sciences (HASS).