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Patrick J. La Riviere is a Professor in the Department of Radiology at the University of Chicago. He has a distinguished research background in the fields of computational imaging, computed tomography, X-ray, microscopy, and fluorescence techniques. His research interests focus on algorithm-enabled imaging systems that span scales from nanometers to meters, emphasizing themes of dose reduction, material identification, and orientation imaging. With exemplary educational credentials including a Ph.D. in Medical Physics from the University of Chicago and a background in physics from Cambridge University and Harvard University, La Riviere has contributed significantly to advancements in imaging technologies. His work has been published extensively, with key insights into volumetric imaging and the use of deep learning for aberration compensation in microscopy. Over the years, he has received notable recognition including the Distinguished Investigator Award from the Academy of Radiology and Biomedical Imaging Research and a Young Investigator Award from IEEE.
University of Chicago • Chicago, IL
Professor in the Department of Radiology, focusing on imaging technologies and methodologies.
Department of Philosophy