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Shubhakar Kalya obtained his Master’s degree in Microelectronics from Indian Institute of Science (IISc), Bangalore, India in 2007 and completed his PhD in Electrical and Electronics Engineering at Nanyang Technological University (NTU), Singapore in 2013. His doctoral research involved nanoscale characterization and reliability failure analysis of high-κ gate dielectrics. Kalya worked as a researcher at the Institute of Materials Research and Engineering (IMRE) in Singapore from July 2009 to December 2011, focusing on characterization techniques such as scanning tunneling microscopy and atomic force microscopy. His research interests include nanoscale characterization and analysis of high-κ gate dielectrics, logic and memory devices, and failure analysis of nanoscale electronic devices. He served as a Visiting Scientist at the Massachusetts Institute of Technology (MIT) in the Electrical Engineering and Computer Science (EECS) Department from January to June 2017. Currently, he is a Lecturer at the Singapore University of Technology and Design (SUTD), where he continues to pursue his research in electronic devices and reliability analysis.
This applies to PhD programs in Architecture and Sustainable Design (ASD), Engineering Product Development (EPD), Engineering Systems and Design (ESD), Information Systems Technology and Design (ISTD), Science, Mathematics and Technology (SMT), and Humanities, Arts and Social Sciences (HASS).