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Shubhakar Kalya obtained his Master’s degree in Microelectronics from the Indian Institute of Science (IISc), Bangalore, India in 2007, followed by a PhD degree in Electrical and Electronics Engineering from Nanyang Technological University (NTU), Singapore in 2012/13. His doctoral studies at NTU involved nanoscale characterization and reliability failure analysis of High-κ gate dielectrics. Additionally, he worked as a researcher at the Institute of Materials Research and Engineering (IMRE) in Singapore, from July 2009 to December 2011, focusing on the characterization of High-κ gate dielectrics using scanning tunneling microscopy and atomic force microscopy. After his tenure at IMRE, he became a Visiting Scientist at the Massachusetts Institute of Technology (MIT) in the Electrical Engineering and Computer Science (EECS) Department from January to June 2017. Currently, he serves as a Senior Lecturer at the Singapore University of Technology and Design (SUTD), where he continues to pursue research in nanoscale characterization, reliability, and failure analysis of electronic devices.
This applies to PhD programs in Architecture and Sustainable Design (ASD), Engineering Product Development (EPD), Engineering Systems and Design (ESD), Information Systems Technology and Design (ISTD), Science, Mathematics and Technology (SMT), and Humanities, Arts and Social Sciences (HASS).