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Wenkun received his PhD from the Optical Semiconductor Devices group at Imperial College London. His thesis focused on nanofabrication, measurement, and microscopy of approximately 10 nm scale single electron transistors. Through optimization of calibration processes, the success percentage of single electron devices significantly improved by approximately 37%. He developed a non-invasive optical dark-field microscopic method for inspecting ~10 nm scale devices, enhancing fault detection capabilities. Wenkun's current research continues to center on nanofabrication, optical applications, and microscopy related to point-contact single electron transistors.
Specialisms available in Materials for the Energy Transition or Theory and Simulation of Materials.