Electrical Properties Mapping Professors in Global

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Tahir Cagin
Texas A&M University United States of America
electronic properties
mechanical properties
magnetic properties
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Mikael Hedenqvist
KTH Royal Institute of Technology Sweden
electrical properties
mechanical properties
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Niels Dam
Technical University of Denmark Denmark
electrical properties
magnetic properties
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Hamid Bekamiri
Aalborg University Denmark
science mapping
technology mapping
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Devanjan Bhattacharya
University of Edinburgh United Kingdom
pattern mapping
digital mapping
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Lucas Caretta
Brown University United States of America
electronic properties
magnetic properties
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Neil Allan
University of Bristol United Kingdom
electronic properties
magnetic properties
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Christopher Murray
University of Pennsylvania United States of America
electronic properties
magnetic properties
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Jose Guivant
University of New South Wales Australia
mapping
3d mapping
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David Leadley
University of Warwick United Kingdom
optical electronic properties
electronic properties of semiconductors
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Benedetto Marelli
Massachusetts Institute of Technology United States of America
optoelectronic properties
mechanical properties
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Yevhenii Biliaiev
University of Southern Denmark Denmark
magneto-electric properties
electron localization
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Xiangdong Xu
Chalmers University of Technology Sweden
electrical measurement techniques
electric power engineering
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Rauan Al-emrani
Chalmers University of Technology Sweden
mechanical properties
coupled electrochemical properties
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Gordon Hedley
University of Glasgow United Kingdom
optoelectronic properties
photophysical properties
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Ruth Cardinaels
Eindhoven University of Technology Belgium
material characterization
(di)electric properties
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Lorenz Herrmann
University of Bern Switzerland
material characterization
electrical engineering applications
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Jon Estrada
University of Michigan United States of America
material characterization
experimental mechanics
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Ram Achar
Carleton University Canada
circuit modeling
electromagnetic compatibility
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Gabriele Gradoni
University of Illinois United States of America
computational electromagnetics
electromagnetic compatibility
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Christopher Trueman
Concordia University Canada
computational electromagnetics
electromagnetic compatibility
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