Advanced Optical Characterization Professors in Global

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Ary Wibowo
Australian National University Australia
optoelectronic characterization
advanced semiconductors
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Rishabh Mishra
University of New South Wales Australia
optical characterization techniques
advanced semiconductor devices
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Ekta Vats
Uppsala University Sweden
optical character recognition
computer vision
image analysis
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Habiba Bougherara
Toronto Metropolitan University Canada
advanced composite materials
mechanical characterization
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Steve Madden
Australian National University Australia
integrated optics
optical coatings
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Andrew Holmes
Imperial College London United Kingdom
integrated optics
optical signal processing
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Christi Madsen
Texas A&M University United States of America
integrated optics
optical filters
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Jérôme Genest
Laval University Canada
optical spectroscopy
optical signal processing
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Peter Reece
University of New South Wales Australia
optical spectroscopy
optical trapping
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Alexander Lvovsky
University of Oxford United Kingdom
optical computing
optical neural networks
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Asbjørn Moltke
Technical University of Denmark Denmark
advanced material characterization
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Katarzyna Janik
University of Southern Denmark Denmark
advanced characterization of materials
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Niamh Fox
University of Manchester United Kingdom
optical characterisation
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Xin Wang
New York University United States of America
optical characterization
computer vision
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Markus Becherer
Technical University of Munich Germany
optical characterization
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Carl Hägglund
Uppsala University Sweden
optical characterization
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Jos Haverkort
Eindhoven University of Technology Belgium
optical characterization
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Masiello Group
University of Washington United States of America
optical characterization
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Euiwon Bae
Purdue University United States of America
optical characterization
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Hajime Ogane
Australian National University Australia
optical characterization
adaptive optics systems
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Ziv Hameiri
University of New South Wales Australia
advanced characterization methods
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