Measurement Properties Of Survey Instruments Professors in Global

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Xianping Liu
University of Warwick United Kingdom
surface measurement characterization
material property measurement
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James Foster
University of Washington United States of America
measurement
survey design
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Jason Southan
University of the West of England United Kingdom
building measurement
quantity surveying
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Marika Wenemark
Linköping University Sweden
survey methodology
survey design
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Vivishek Sudhir
Massachusetts Institute of Technology United States of America
precision measurements
quantum measurements
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Rana Adhikari
California Institute of Technology United States of America
precision measurements
quantum measurements
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Stephen Harris
University of New South Wales Australia
satellite measurements
airborne measurements
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Ralph Spolenak
ETH Zurich Switzerland
mechanical properties of materials
physical properties of materials
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Sarah Tipping
University of Glasgow United Kingdom
survey methodology
statistical methods for survey data analysis
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Benedetto Marelli
Massachusetts Institute of Technology United States of America
mechanical properties
optoelectronic properties
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Erin Hartman
University of California, Berkeley United States of America
survey design
survey analysis
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Stefan Huber
Friedrich-Alexander-Universität Erlangen-Nürnberg Germany
measurement methods
optical measurement techniques
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Frank Neitzel
Technical University of Berlin Germany
engineering surveying
industrial surveys
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Mikael Hedenqvist
KTH Royal Institute of Technology Sweden
mechanical properties
electrical properties
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Victor Lefèvre
Northwestern University United States of America
mechanical properties
physical properties
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Tahir Cagin
Texas A&M University United States of America
mechanical properties
electronic properties
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Phil Dobson
University of Glasgow United Kingdom
mechanical properties of materials
thermal properties of materials
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Neil Allan
University of Bristol United Kingdom
surface properties
electronic properties
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Joshua Robinson
Pennsylvania State University United States of America
physical properties
electronic properties
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Mihailo Trifunac
University of Southern California United States of America
instrumentation measurement
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Elisa Cavatorta
King's College London United Kingdom
measurement tools
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