Growth And Characterization Of Thin Films And Nanostructures Professors in Global

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Rehan Kapadia
University of Southern California United States of America
thin-film growth
nanomaterials growth
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Jens Harting
Friedrich-Alexander-Universität Erlangen-Nürnberg Germany
physics of thin films
modeling thin films
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Jens Birch
Linköping University Sweden
thin film characterization
nanostructures
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Marin Alexe
University of Warwick United Kingdom
thin film growth
characterization of metal oxide thin films
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Joseph Falson
California Institute of Technology United States of America
thin-film growth
materials characterization
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R. Ramesh
University of California, Berkeley United States of America
thin film growth
nanoscale characterization
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Jakob Wagner
Technical University of Denmark Denmark
micro- and nanostructured materials
nanocharacterization
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Donald Maclaren
University of Glasgow United Kingdom
nanostructural characterization
nanometric characterization of materials
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Andreas Schueler
École Polytechnique Fédérale de Lausanne Switzerland
optical properties of thin films
thin film technologies
nanostructured materials
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William Nix
Stanford University United States of America
nanostructures
thin film mechanics
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Irving Herman
Columbia University United States of America
thin film processing
nanostructured materials
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Tom Smy
Carleton University Canada
thin film processing
nano-structured materials
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Suzanne Mohney
Pennsylvania State University United States of America
nanostructures
thin films
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François Schiettekatte
University of Montreal Canada
nanostructures
thin films
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Andriy Romanyuk
University of Basel Switzerland
nanostructures
thin films
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Carl Thompson
Massachusetts Institute of Technology United States of America
nanostructures
thin films
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Qi Li
Pennsylvania State University United States of America
nanostructures
thin films
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Johan Hoefnagels
Eindhoven University of Technology Belgium
thin film mechanics
microscopic characterization
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Katsuyo Thornton
University of Michigan United States of America
nanostructures
microstructures
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Akintunde Akinwande
Massachusetts Institute of Technology United States of America
nanostructures
microstructures
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Shefford Baker
Cornell University Netherlands
microstructural characterization
thin films
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