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Thin Film Characterization
Thin Film Characterization Professors in Global
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Professor
Marin Alexe
University of Warwick
United Kingdom
characterization of metal oxide thin films
thin film growth
ultra-thin films
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Professor
Jens Harting
Friedrich-Alexander-Universität Erlangen-Nürnberg
Germany
modeling thin films
physics of thin films
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Professor
Johan Hoefnagels
Eindhoven University of Technology
Belgium
thin film mechanics
microscopic characterization
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Professor
Badrinath Veluri
Aarhus University
Denmark
thin films
material characterization
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Professor
Alex Dommann
University of Bern
Switzerland
thin films
material characterization
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Professor
Shefford Baker
Cornell University
Netherlands
thin films
microstructural characterization
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Professor
Adrienne Stiff-roberts
Duke University
Singapore
thin-film deposition
organic thin films
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Professor
Adrienne Stiff-roberts
Duke University
Singapore
thin-film deposition
organic thin films
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Professor
Adrienne Stiff-roberts
Duke University
Singapore
thin-film deposition
organic thin films
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Professor
Adrienne Stiff-roberts
Duke University
Singapore
thin-film deposition
organic thin films
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Professor
Um Aryal
University of Southern Denmark
Denmark
thin films nanotechnology
surface material characterization
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Professor
Ulf Jansson
Uppsala University
Sweden
thin film materials
amorphous films
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Professor
Joseph Falson
California Institute of Technology
United States of America
thin-film growth
materials characterization
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Professor
Peter Petrov
Imperial College London
United Kingdom
nano-scale thin films
functional oxide thin films
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Professor
Soumya Sarkar
University of Southampton
United Kingdom
thin film oxides
characterization
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Professor
R. Ramesh
University of California, Berkeley
United States of America
thin film growth
nanoscale characterization
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Professor
Ioannis Kymissis
Columbia University
United States of America
thin film electronics
thin film piezoelectric devices
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Professor
Carl Hägglund
Uppsala University
Sweden
optical characterization
thin film solar cells
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Professor
Guo-zhen Zhu
University of Manitoba
Canada
material characterization
advanced materials characterization
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Professor
Marcel Verheijen
Eindhoven University of Technology
Belgium
materials characterization
high resolution tem characterization
thin-film solar cells
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Professor
Andrei Sarua
University of Bristol
United Kingdom
device characterization
electro-optical characterization
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