Mechanical Properties Of Thin Films Professors in Global

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Marin Alexe
University of Warwick United Kingdom
characterization of metal oxide thin films
thin film growth
ultra-thin films
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Jens Harting
Friedrich-Alexander-Universität Erlangen-Nürnberg Germany
physics of thin films
modeling thin films
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William Nix
Stanford University United States of America
thin film mechanics
mechanics of materials
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Shefford Baker
Cornell University Netherlands
thin films
mechanical properties of materials
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Ulf Jansson
Uppsala University Sweden
thin film materials
amorphous films
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Ioannis Kymissis
Columbia University United States of America
thin film electronics
thin film piezoelectric devices
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Yinong Liu
University of Western Australia Australia
thin films
mechanical behaviour of materials
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Brian Sheldon
Brown University United States of America
thin films
mechanical behavior of materials
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Peter Petrov
Imperial College London United Kingdom
nano-scale thin films
functional oxide thin films
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Ting Tsui
University of Waterloo Canada
thin film delaminations
small scale mechanical properties
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Barry Rand
Princeton University United States of America
thin film electronics
optical properties of materials
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Adrienne Stiff-roberts
Duke University Singapore
organic thin films
thin-film deposition
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Adrienne Stiff-roberts
Duke University Singapore
organic thin films
thin-film deposition
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Adrienne Stiff-roberts
Duke University Singapore
organic thin films
thin-film deposition
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Adrienne Stiff-roberts
Duke University Singapore
organic thin films
thin-film deposition
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Ralph Spolenak
ETH Zurich Switzerland
mechanical properties of materials
physical properties of materials
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Phil Dobson
University of Glasgow United Kingdom
mechanical properties of materials
thermal properties of materials
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Aman Haque
Pennsylvania State University United States of America
mechanical properties
ultra-thin films
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David Crandles
Brock University Canada
optical properties of materials
structural properties of materials
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Charlotte Björkman
Uppsala University Sweden
thin film solar cells
material properties
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David Steigmann
University of California, Berkeley United States of America
mechanics of thin films
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