Thin Films Nanostructures Characterization Professors in Global

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Andreas Schueler
École Polytechnique Fédérale de Lausanne Switzerland
optical properties of thin films
thin film technologies
nanostructured materials
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Marin Alexe
University of Warwick United Kingdom
characterization of metal oxide thin films
thin film growth
ultra-thin films
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Qi Li
Pennsylvania State University United States of America
thin films
nanostructures
reduced dimension nanostructures
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Jens Birch
Linköping University Sweden
thin film characterization
nanostructures
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Jens Harting
Friedrich-Alexander-Universität Erlangen-Nürnberg Germany
physics of thin films
modeling thin films
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Tomasz Kowalewski
Carnegie Mellon University United States of America
characterization of nanostructures
nano-structured materials
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Donald Maclaren
University of Glasgow United Kingdom
nanostructural characterization
nanometric characterization of materials
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Um Aryal
University of Southern Denmark Denmark
thin films nanotechnology
surface material characterization
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Peter Petrov
Imperial College London United Kingdom
nano-scale thin films
functional oxide thin films
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R. Van Dover
Cornell University Netherlands
characterization of nanometer-scale materials
uhf properties of magnetic thin films
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William Nix
Stanford University United States of America
thin film mechanics
nanostructures
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Shefford Baker
Cornell University Netherlands
thin films
microstructural characterization
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Andriy Romanyuk
University of Basel Switzerland
thin films
nanostructures
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Suzanne Mohney
Pennsylvania State University United States of America
thin films
nanostructures
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Carl Thompson
Massachusetts Institute of Technology United States of America
thin films
nanostructures
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Johan Hoefnagels
Eindhoven University of Technology Belgium
thin film mechanics
microscopic characterization
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Alejandro De Lozanne
University of Texas at Austin United States of America
thin films devices
nanostructures
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François Schiettekatte
University of Montreal Canada
thin films
nanostructures
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Rui Huang
University of Texas at Austin United States of America
mechanical instability in thin films
nanostructures
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Yutao Pei
University of Groningen Netherlands
coatings thin films
nanostructured materials
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Ivan Schuller
University of California, San Diego United States of America
insulating thin films
nanostructures
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