Aberration Corrected Electron Microscopy Professors in Global

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Danielle Hickey
Pennsylvania State University United States of America
aberration-corrected electron microscopy
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Judy Kim
University of Oxford United Kingdom
aberration corrected transmission electron microscopy
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Angus Kirkland
University of Oxford United Kingdom
aberration corrected electron optics
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Stanford University United States of America
aberration correction
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Nils Truedsson
University of Edinburgh United Kingdom
electromagnetic corrections
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Di Wang
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Torsten Scherer
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Martin Velazquez-rizo
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Adam Mckenzie
University of Glasgow United Kingdom
advanced electron microscopy
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Ye Li
University of Toronto Canada
aberration detection
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Maximilian Töllner
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Said Nourbakhsh
New York University Tandon School of Engineering United States of America
electron microscopy
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Arthur Blackburn
University of Victoria Canada
electron microscopy
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John Titchmarsh
University of Oxford United Kingdom
electron microscopy
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Richard Beanland
University of Warwick United Kingdom
electron microscopy
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Peter Hirsch
University of Oxford United Kingdom
electron microscopy
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Daniel Rainer
University of Southampton United Kingdom
electron microscopy
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Nils Hauff
Umeå University Sweden
electron microscopy
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Scott Findlay
Monash University Australia
electron microscopy
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Uta Klement
Chalmers University of Technology Sweden
electron microscopy
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Monia Runge Nielsen
Technical University of Denmark Denmark
electron microscopy
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