Aberration Corrected Electron Microscopy Professors in Global

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Nils Truedsson
University of Edinburgh United Kingdom
electromagnetic corrections
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Adam Mckenzie
University of Glasgow United Kingdom
advanced electron microscopy
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Torsten Scherer
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Martin Velazquez-rizo
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Maximilian Töllner
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Di Wang
Karlsruhe Institute of Technology Germany
advanced electron microscopy
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Marek Skowronski
Carnegie Mellon University United States of America
electron microscopy
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Lia Stanciu-gregory
Purdue University United States of America
electron microscopy
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Ian Maclaren
University of Glasgow United Kingdom
electron microscopy
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Kevin Plucknett
Dalhousie University Canada
electron microscopy
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Kenneth Livi
Johns Hopkins University United States of America
electron microscopy
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Said Nourbakhsh
New York University Tandon School of Engineering United States of America
electron microscopy
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Fred Rendell-bhatti
University of Glasgow United Kingdom
electron microscopy
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Richard Beanland
University of Warwick United Kingdom
electron microscopy
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Frances Ross
Massachusetts Institute of Technology United States of America
electron microscopy
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Francisco Alvarado
University of Warwick United Kingdom
electron microscopy
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Peng Wang
University of Warwick United Kingdom
electron microscopy
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Ana Sanchez
University of Warwick United Kingdom
electron microscopy
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Evelina Liarou
University of Warwick United Kingdom
electron microscopy
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John Mcgrath
King's College London United Kingdom
electron microscopy
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Candice Roufosse
Imperial College London United Kingdom
electron microscopy
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