Computer Based Testing Professors in Global

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Ben Jar
University of Alberta Canada
material testing
computer models
impact testing
test methods
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Sigrid Eldh
Carleton University Canada
software testing
test technologies
test automation
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Shadi Balawi
Texas A&M University United States of America
experimental testing
static testing
dynamic testing
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Ibrahim Deiab
University of Guelph Canada
computer-aided engineering
computer-aided manufacturing
computer-aided design
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Michael Beltran
Northwestern University United States of America
computer-aided engineering
computer-aided manufacturing
computer-aided design
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Ulrika Jonsson
University of Gothenburg Sweden
computer-based testing
high-stakes testing
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Yaping Luo
Eindhoven University of Technology Belgium
model-based testing
test automation
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Paul Brostean
Uppsala University Sweden
software testing
security testing
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August Shi
University of Texas at Austin United States of America
software testing
regression testing
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Marcia Linn
University of California, Berkeley United States of America
testing
computer-mediated learning
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Parvin Mousavi
Queen's University Canada
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computer-aided diagnosis
computer-assisted diagnosis
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Steven Montner
University of Chicago United States of America
computer-aided diagnosis
computerized image analysis
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James Zheng
Macquarie University Australia
testing cyber-physical systems
verification of software systems
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Hakan Erdogmus
Carnegie Mellon University United States of America
software testing and verification
test-driven approaches
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Vijay Ganesh
University of Waterloo Canada
automated testing
computer security
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Rob Meijer
University of Groningen Netherlands
psychological testing
educational testing
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Samuel Armato
University of Chicago United States of America
computer-aided diagnosis
computed tomography
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Muirne Paap
University of Groningen Netherlands
multidimensional computerized adaptive testing
test theory
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Samuel Armato
University of Chicago United States of America
computer-aided diagnosis
computed tomography
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Michael Andre
University of California, San Diego United States of America
computer-aided diagnosis
computed tomography
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Jinhan Kim
Università della Svizzera italiana Switzerland
deep learning system testing
mutation testing
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