Error Detection Professors in Global

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Hermann Ney
RWTH Aachen University Germany
image object recognition
machine learning
sign language recognition
text image recognition
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Francisco Esparza Estaun
Technical University of Munich Germany
error detection in software systems
software verification
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Guillermo Suarez De Tangil
King's College London United Kingdom
fraud detection
malware detection
machine learning
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Leman Akoglu
Carnegie Mellon University United States of America
fraud detection
anomaly detection
outlier detection
pattern discovery
machine learning
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Khaled Abdel-ghaffar
University of California, Davis United States of America
error-detecting codes
error-correcting codes
decoding algorithms
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Shizhen Chang
Linköping University Sweden
change detection
feature retrieval
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Richard Mccreadie
University of Glasgow United Kingdom
event detection
information retrieval
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Kaustav Chatterjee
Technical University of Denmark Denmark
error-correcting schemes
fault-tolerant computing
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Doris Tsao
University of California, Berkeley United States of America
object recognition
object segmentation
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Benn Sejergaard
Aalborg University Denmark
tracking detection
diagnostic accuracy
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Bob Woodham
University of British Columbia Canada
object recognition
machine vision
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Gerasimos Spanakis
Maastricht University Netherlands
topic detection
machine learning
information retrieval
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Rui Pires Da Silva Castro
Eindhoven University of Technology Belgium
pattern recognition
network inference
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Ke Chen
University of Manchester United Kingdom
pattern recognition
machine learning
machine perception
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Chin-hui Lee
Georgia Institute of Technology United States of America
pattern recognition
machine learning
information retrieval
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Federico De Martino
Maastricht University Netherlands
pattern recognition
machine learning
decoding
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Dirk Colbry
Michigan State University United States of America
pattern recognition
machine vision
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Majid Ahmadi
University of Windsor Canada
pattern recognition
machine vision
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Majid Ahmadi
University of Windsor Canada
pattern recognition
machine vision
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Irwin Donis-gonzalez
University of California United States of America
pattern recognition
machine vision
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Jeroen Keiren
Eindhoven University of Technology Belgium
model checking
hardware verification
software verification
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