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Light Scattering Based Detection
Light Scattering Based Detection Professors in Global
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Professor
Machteld Kamminga
Utrecht University
Netherlands
light scattering
x-ray scattering
neutron scattering
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Professor
Ed Fry
Texas A&M University
United States of America
light scattering
multichannel scattered light polarization analysis
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Professor
Young Kim
Purdue University
United States of America
light scattering spectroscopy
enhanced backscattering
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Professor
Andrew Mccluskey
University of Bristol
United Kingdom
x-ray scattering
neutron scattering
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Professor
Peter Willendrup
Technical University of Denmark
Denmark
x-ray scattering
neutron scattering
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Professor
Lise Arleth
University of Copenhagen
Denmark
x-ray scattering
neutron scattering
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Professor
Tom Mccoy
Delft University of Technology
Netherlands
x-ray scattering
neutron scattering
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Professor
Sara Haravifard
Duke University
Singapore
x-ray scattering
neutron scattering
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Professor
Maxim Avdeev
University of Sydney
Australia
x-ray scattering
neutron scattering
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Professor
John Daniels
University of New South Wales
Australia
x-ray scattering
neutron scattering
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Professor
Drew Marquardt
University of Windsor
Canada
x-ray scattering
neutron scattering
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Professor
Sara Haravifard
Duke University
Singapore
x-ray scattering
neutron scattering
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Professor
Oliver Hammond
KTH Royal Institute of Technology
Sweden
small angle scattering
neutron scattering
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Professor
Sankaran Iyer
University of New South Wales
Australia
object detection
pedestrian detection
anomaly detection
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Professor
J.c. Van Gemert
Delft University of Technology
Netherlands
detection
pattern recognition
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Professor
Olwyn Byron
University of Glasgow
United Kingdom
small angle x-ray scattering
small angle neutron scattering
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Professor
Leonie Van 't Hag
Monash University
Australia
small angle x-ray scattering
small angle neutron scattering
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Professor
Du Huynh
University of Western Australia
Australia
object detection
pattern recognition
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Professor
Carsten Rockstuhl
Karlsruhe Institute of Technology
Germany
light localization
light propagation
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Professor
Georgios Fellouris
University of Illinois
United States of America
sequential detection
anomaly detection
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Professor
Alexander Grötsch
KTH Royal Institute of Technology
Sweden
small-angle x-ray scattering
wide-angle x-ray scattering
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