Magneto Optical Characterization Professors in Global

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Timothy Chupp
University of Michigan United States of America
optical magnetometry
magnetometry
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Markus Becherer
Technical University of Munich Germany
optical characterization
electrical characterization
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Roger Magnusson
Linköping University Sweden
optical mechanical properties
optical properties
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Truong Vo-van
Concordia University Canada
optical characterization methods
optical properties of metallic nanoparticles
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Lucas Caretta
Brown University United States of America
optical properties
magnetic properties
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Christopher Murray
University of Pennsylvania United States of America
optical properties
magnetic properties
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Jon Duffy
University of Warwick United Kingdom
magnetization densities
magnetism
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Melanie Campbell
University of Waterloo Canada
optical properties
modeling optical systems
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Marijke Haverkorn Van Rijsewijk
Radboud University Netherlands
optical polarimetry
magnetism
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Robert Birgeneau
Massachusetts Institute of Technology United States of America
one-dimensional magnets
two-dimensional magnets
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David Leadley
University of Warwick United Kingdom
optical properties of semiconductors
optical electronic properties
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Silvania Pereira
Delft University of Technology Netherlands
optical metrology
optical physics
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Donald Maclaren
University of Glasgow United Kingdom
nanometric characterization of materials
nanostructural characterization
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John Ketterson
Northwestern University United States of America
linear optical phenomena
magnetic superconducting properties
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Richard Harrison
University of Cambridge United Kingdom
environmental magnetism
mineral magnetism
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John Ketterson
Northwestern University United States of America
optical phenomena
magnetic superconducting properties
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Carl Paterson
Imperial College London United Kingdom
optical imaging
optical physics
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Niamh Fox
University of Manchester United Kingdom
optical characterisation
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Xin Wang
New York University United States of America
optical characterization
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Carl Hägglund
Uppsala University Sweden
optical characterization
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Jos Haverkort
Eindhoven University of Technology Belgium
optical characterization
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