Parameter Identification Professors in Global

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Ralf Peeters
Maastricht University Netherlands
system identification
statistical parameter estimation
pattern recognition feature extraction
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Ralf Peeters
Maastricht University Netherlands
system identification
statistical parameter estimation
pattern recognition feature extraction
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Carlos Domingo-felez
University of Glasgow United Kingdom
parameter estimation
model identification
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James Spall
Johns Hopkins University United States of America
parameter estimation
system identification
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James Spall
Johns Hopkins University United States of America
parameter estimation
system identification
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John Oommen
Carleton University Canada
pattern recognition
statistical pattern recognition
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Marios Savvides
Carnegie Mellon University United States of America
pattern recognition
biometric identification
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Chin-hui Lee
Georgia Institute of Technology United States of America
pattern recognition
information retrieval
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Clodualdo Aranas
University of New Brunswick Canada
materials characterization
non-destructive identification
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Sascha Svendsen
Aarhus University Denmark
information processing
information retrieval
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Hajime Yamamoto
Aarhus University Denmark
information processing
information retrieval
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Rasmus Møller
Technical University of Denmark Denmark
information processing
information retrieval
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Wenzheng Yin
University of Copenhagen Denmark
information processing
information retrieval
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Ihab Soliman
University of Western Australia Australia
information processing
information retrieval
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James Green
Carleton University Canada
pattern classification
machine intelligence
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Paul Mayne
Georgia Institute of Technology United States of America
geotechnical parameter identification
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Dirk Husmeier
University of Glasgow United Kingdom
parameter inference
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Prashant Singh
Uppsala University Sweden
parameter inference
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Max Ramgraber
Delft University of Technology Netherlands
parameter inference
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Christopher Messenger
University of Glasgow United Kingdom
parameter estimation
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Anthony Patera
Massachusetts Institute of Technology United States of America
parameter estimation
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