Device Characterization Professors in Global

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Tahir Cagin
Texas A&M University United States of America
characterization
electronic properties
device sensor applications
mechanical properties
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Thomas Jackson
Pennsylvania State University United States of America
device physics
display technology
semiconductor devices
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Alexander Bardelcik
University of Guelph Canada
micro-mechanical characterization
fracture characterization
constitutive characterization
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Andrei Sarua
University of Bristol United Kingdom
device characterization
electro-optical characterization
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Gilberto Umana Membreno
University of Western Australia Australia
characterization
device design
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Andrea Ferrari
University of Cambridge United Kingdom
characterization
devices
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Yuxuan Lin
Texas A&M University United States of America
characterization
devices
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Yu Zhong
Cornell University Netherlands
characterization
device fabrication
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Scott Roy
University of Glasgow United Kingdom
device modelling
device scaling
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Guo-zhen Zhu
University of Manitoba Canada
material characterization
advanced materials characterization
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David Dixon
University of British Columbia Canada
materials characterization
materials properties
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Markus Becherer
Technical University of Munich Germany
electrical characterization
optical characterization
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Marcel Verheijen
Eindhoven University of Technology Belgium
materials characterization
high resolution tem characterization
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Leonardo Simon
University of Waterloo Canada
characterization of materials
physical properties
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Jinghao Xu
Linköping University Sweden
characterization
mechanical properties
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Clodualdo Aranas
University of New Brunswick Canada
materials characterization
mechanical properties
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Hao Zhang
University of Alberta Canada
materials characterization
mechanical properties
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Um Aryal
University of Southern Denmark Denmark
surface material characterization
device fabrication
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Muhammad Afzal
University of New Brunswick Canada
mechanical characterization
physio-chemical characterization
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Suzanne Mohney
Pennsylvania State University United States of America
electrical characterization
electronic devices
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Martin Kuball
University of Bristol United Kingdom
device thermography
semiconductor devices
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