X Ray Metrology Professors in Global

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Marie-christine Zdora
Monash University Australia
x-ray physics
x-ray imaging
x-ray multi-modal imaging
x-ray dark-field imaging
x-ray ct imaging
x-ray technique development
x-ray speckle-based imaging
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Linda Croton
Monash University Australia
x-ray physics
x-ray imaging
x-ray optics
x-ray ct imaging
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Wenjuan Sun
KU Leuven Belgium
surface metrology
dimensional metrology
x-ray computed tomography
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Christian Schroer
University of Hamburg Germany
x-ray optics
x-ray microscopy
x-ray nanoscience
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John Mcbride
University of Southampton United Kingdom
x-ray metrology
optical metrology
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Dan Mccammon
University of Wisconsin–Madison United States of America
x-ray instrumentation
x-ray astronomy
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Martin Bremholm
Aarhus University Denmark
x-ray radiation
x-ray crystallography
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Henrik Birkedal
Aarhus University Denmark
x-ray radiation
x-ray crystallography
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Arne Jegers
Technical University of Denmark Denmark
x-ray astronomy
ray-tracing
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Bernd Von.issendorff
University of Freiburg Germany
x-ray absorption
x-ray scattering
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Michael Tobar
University of Western Australia Australia
quantum metrology
frequency metrology
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Matthias Alfeld
Delft University of Technology Netherlands
x radiation
x-ray fluorescence analysis
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Nancy Ford
University of British Columbia Canada
x-ray imaging
dental x-ray imaging
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Steven Allen
Stanford University United States of America
x-ray astronomy
x-ray detector development
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Davood Khodadad
Umeå University Sweden
optical metrology
x-ray tomographic methods
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David Attwood
University of California, Berkeley United States of America
x-rays
coherence of x-ray wavelengths
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Gaurava Jaisawal
Technical University of Denmark Denmark
x-ray instrumentation
x-ray binaries
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David Hawthorn
University of Waterloo Canada
x-ray spectroscopy
x-ray scattering
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David Stuart
University of Oxford United Kingdom
x-ray crystallography
x-ray microscopy
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Denis Leahy
University of Calgary Canada
x-ray astronomy
x-ray binaries
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Chathura Bandutunga
Australian National University Australia
laser frequency metrology
interferometric metrology
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