Defect Characterisation Professors in Global

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Alexander Bardelcik
University of Guelph Canada
fracture characterization
constitutive characterization
micro-mechanical characterization
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Clodualdo Aranas
University of New Brunswick Canada
material defects
materials characterization
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Duncan Walker
Texas A&M University United States of America
defect-based test
fault diagnosis
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David Fenning
University of California, San Diego United States of America
defect engineering
x-ray characterization
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Wout Feitz
Radboud University Netherlands
genetic defects
urological defects
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Ary Wibowo
Australian National University Australia
defect engineering
optoelectronic characterization
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Jian-min Zuo
Monash University Australia
study of materials' defects
advanced characterization
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Markus Becherer
Technical University of Munich Germany
optical characterization
electrical characterization
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Muhammad Afzal
University of New Brunswick Canada
mechanical characterization
physio-chemical characterization
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Edita Jurak
University of Groningen Netherlands
carbohydrate characterization
enzyme characterization
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Tomasz Kowalewski
Carnegie Mellon University United States of America
device fabrication and characterization
characterization of nanostructures
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Thorsten Trupke
University of New South Wales Australia
defect characterisation
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David Payne
Macquarie University Australia
material defect characterization
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Neil Allan
University of Bristol United Kingdom
defect properties
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Jakob Ahl
Technical University of Denmark Denmark
error characterization
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Yue Fan
University of Michigan United States of America
defect behaviors
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Mohamed Amer
University of Southampton United Kingdom
characterisation
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Ian Davidson
University of Southampton United Kingdom
characterisation
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Binesh Veettil
Macquarie University Australia
characterisation
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Ming Li
Macquarie University Australia
characterisation
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Liangchi Zhang
University of New South Wales Australia
characterisation
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