X Ray Characterization Professors in Global

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Linda Croton
Monash University Australia
x-ray optics
x-ray imaging
x-ray physics
x-ray ct imaging
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Marianne Liebi
École Polytechnique Fédérale de Lausanne Switzerland
material characterization
x-ray imaging techniques
small-angle x-ray scattering
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Alexander Bardelcik
University of Guelph Canada
micro-mechanical characterization
fracture characterization
constitutive characterization
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Ekta Vats
Uppsala University Sweden
image analysis
optical character recognition
computer vision
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Emielda Yusiharni
University of Western Australia Australia
x-ray diffraction
material characterization
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Siegbert Schmid
University of Sydney Australia
x-ray diffraction
material characterisation
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Henrik Birkedal
Aarhus University Denmark
x-ray radiation
x-ray crystallography
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Martin Bremholm
Aarhus University Denmark
x-ray radiation
x-ray crystallography
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Markus Becherer
Technical University of Munich Germany
optical characterization
electrical characterization
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Marie-christine Zdora
Monash University Australia
x-ray imaging
x-ray physics
x-ray ct imaging
x-ray dark-field imaging
x-ray technique development
x-ray speckle-based imaging
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Bernd Von.issendorff
University of Freiburg Germany
x-ray scattering
x-ray absorption
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Henning Poulsen
Technical University of Denmark Denmark
materials characterization
x-ray tomography
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David Hawthorn
University of Waterloo Canada
x-ray scattering
x-ray spectroscopy
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Christian Schroer
University of Hamburg Germany
x-ray optics
x-ray microscopy
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Xin Wang
New York University United States of America
optical characterization
computer vision
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David Stuart
University of Oxford United Kingdom
x-ray crystallography
x-ray microscopy
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Dan Mccammon
University of Wisconsin–Madison United States of America
x-ray astronomy
x-ray instrumentation
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Muhammad Afzal
University of New Brunswick Canada
mechanical characterization
physio-chemical characterization
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Arne Jegers
Technical University of Denmark Denmark
x-ray astronomy
ray-tracing
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Guo-zhen Zhu
University of Manitoba Canada
material characterization
advanced materials characterization
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Sandro Olivo
University College London United Kingdom
x-ray imaging
x-ray phase contrast imaging
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