In Situ Metrology Professors in Global

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Tao Sun
Northwestern University United States of America
in situ characterization
metrology
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Wenjuan Sun
KU Leuven Belgium
surface metrology
dimensional metrology
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Michael Tobar
University of Western Australia Australia
quantum metrology
frequency metrology
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Chenhui Shao
University of Michigan United States of America
3d metrology
in-situ process monitoring real-time control
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John Mcbride
University of Southampton United Kingdom
optical metrology
x-ray metrology
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Chathura Bandutunga
Australian National University Australia
interferometric metrology
laser frequency metrology
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Josh Giles
University of Victoria Canada
in-silico modelling
in-vitro experimentation
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Stephan Hofmann
University of Cambridge United Kingdom
in-situ metrology
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Ehsan Toyserkani
University of Waterloo Canada
in-situ monitoring
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James Engstrom
Cornell University Netherlands
in-situ monitoring
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Irene Rocchi
Technical University of Denmark Denmark
in-situ monitoring
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Martin Hirschi
ETH Zurich Switzerland
in-situ remote sensing
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Jonathan Crosier
University of Manchester United Kingdom
in-situ instrumentation
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Jennifer Kaiser
Georgia Institute of Technology United States of America
in-situ remote sensing
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Fernando Patino Ramirez
Georgia Institute of Technology United States of America
in-situ testing
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Ashley Bucsek
University of Michigan United States of America
in situ characterization
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Gayle Lourens
Michigan State University United States of America
in-situ simulation
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Mike Gomez
University of Washington United States of America
in-situ testing
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Aflizal Arafianto
University of Western Australia Australia
in-situ testing
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David Elwood
University of Saskatchewan Canada
in-situ testing
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Roman Hryciw
University of Michigan United States of America
in-situ testing
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