Optical And X Ray Analytical Tools Professors in Global

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Xingjie Ni
Pennsylvania State University United States of America
optical materials
optical sensing
transformation optics devices
optical communications
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Linda Croton
Monash University Australia
x-ray optics
x-ray imaging
x-ray physics
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Carl Paterson
Imperial College London United Kingdom
optical imaging
optical physics
ocular imaging
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Andy Harvey
University of Glasgow United Kingdom
optical measurement
optics
ophthalmic imaging
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Steve Sheard
University of Oxford United Kingdom
optical sensors
optics
optical waveguide devices
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Bill Corcoran
Monash University Australia
optical materials
optics
optical communications
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Allan Hornstrup
Technical University of Denmark Denmark
x-ray instrumentation
optical telescopes
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Dan Mccammon
University of Wisconsin–Madison United States of America
x-ray instrumentation
x-ray astronomy
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Michael Littman
Princeton University United States of America
optical instruments
optical materials
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Julia Kornfield
California Institute of Technology United States of America
optical techniques
x-ray techniques
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Marios Georgiadis
Stanford University United States of America
optical techniques
x-ray imaging
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Dan Erwin
University of Southern California United States of America
optical instruments
optics
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Dan Erwin
University of Southern California United States of America
optical instruments
optics
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Dan Erwin
University of Southern California United States of America
optical instruments
optics
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Michael Fokine
KTH Royal Institute of Technology Sweden
optical measurement techniques
optical measurement technology
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Benjamin Vakoc
Harvard-MIT Health Sciences Technology United States of America
optical imaging
optical devices
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Guy Curry
Texas A&M University United States of America
analytical tools
simulation tools
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Klaus Ehrmann
University of New South Wales Australia
ophthalmic instrumentation
optical metrology
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David Sedarsky
Chalmers University of Technology Sweden
optical measurements
applied optics
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Marie-christine Zdora
Monash University Australia
x-ray imaging
x-ray physics
x-ray speckle-based imaging
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Christian Schroer
University of Hamburg Germany
x-ray optics
x-ray microscopy
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