Optical Strain Measurement Professors in Global

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Carl Paterson
Imperial College London United Kingdom
optical imaging
optical propagation
optical physics
ocular imaging
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Steve Madden
Australian National University Australia
optical switching
optical transmission systems
optical coatings
optical metrology system development
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Andy Harvey
University of Glasgow United Kingdom
optical measurement
optics
ophthalmic imaging
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Jérôme Genest
Laval University Canada
optical spectroscopy
optical instrumentation
optical signal processing
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Vagn Hanson
Technical University of Denmark Denmark
optical sensor technology
statistical optics
optical turbulence
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Alan Willner
University of Southern California United States of America
optical sensing
optical signal processing
optical communication systems
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Xingjie Ni
Pennsylvania State University United States of America
optical sensing
optical materials
optical communications
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Alexander Rohrbach
University of Freiburg Germany
optics
optical traps
optical tweezers
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Axel Kuhn
University of Oxford United Kingdom
optical physics
optical trapping
optical microcavities
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Bill Corcoran
Monash University Australia
optics
optical materials
optical communications
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Vasudevan Lakshminarayanan
University of Waterloo Canada
optics
optical systems
optical devices technology
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Michael Fokine
KTH Royal Institute of Technology Sweden
optical measurement technology
optical measurement techniques
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Jakob Wilm
University of Southern Denmark Denmark
optical measurement technologies
optical metrology
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Günter Gauglitz
University of Tübingen Germany
optical spectroscopy
optical sensors
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Thomas Gaylord
Georgia Institute of Technology United States of America
optical sensors
optics instrumentation
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Klaus Ehrmann
University of New South Wales Australia
optical metrology
ophthalmic instrumentation
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Claire Gmachl
Princeton University United States of America
optical sensors
optics
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Osamu Takayama
Technical University of Denmark Denmark
optical sensors
optics
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Shwetadwip Chowdhury
University of Texas at Austin United States of America
optical scatter
optical microscopy
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Silvania Pereira
Delft University of Technology Netherlands
optical metrology
optical physics
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Christian Moreau
Concordia University Canada
optical sensors
optical pyrometry
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