Advanced Monitoring Professors in Global

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Debangsu Bhattacharyya
West Virginia University United States of America
advanced manufacturing
advanced modeling
condition monitoring
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William Melek
University of Waterloo Canada
advanced manufacturing
advanced robotics
advanced mechatronics systems
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James Von Oehsen
Carnegie Mellon University United States of America
advanced computing
advanced networking
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Josh Woods
Queen's University Canada
advanced sensors
structural monitoring
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Oleg Gang
Columbia University United States of America
advanced manufacturing
advanced materials
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Ann Mescher
University of Washington United States of America
advanced manufacturing
advanced materials
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Joanna Wong
University of Calgary Canada
advanced manufacturing
advanced materials
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Mohammad Rafiee
University of Ottawa Canada
advanced manufacturing
advanced materials
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Youmin Zhang
Concordia University Canada
monitoring
advanced signal processing techniques
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Mostafa Hassani
Cornell University Netherlands
advanced manufacturing
advanced materials
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Kaan Erkorkmaz
University of Waterloo Canada
advanced manufacturing
advanced robotics
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Mohamad Bayat
Technical University of Denmark Denmark
advanced process
performance monitoring
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Leyla Özkan
Eindhoven University of Technology Belgium
advanced process control
process monitoring
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Molly Stevens
University of Oxford United Kingdom
advanced diagnostics
advanced therapeutics
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Saya Lee
Pennsylvania State University United States of America
advanced measurement techniques
advanced reactors
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Norman Zhou
University of Waterloo Canada
advanced manufacturing
process monitoring
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Jihoon Jeong
Texas A&M University United States of America
advanced manufacturing
process monitoring
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Binayak Bhandari
University of New South Wales Australia
advanced manufacturing
advanced composites
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Arnick Abdollahi
Australian National University Australia
advanced machine learning
environmental monitoring
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Ehsan Toyserkani
University of Waterloo Canada
advanced manufacturing
in-situ monitoring
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Salvador Garcia Muñoz
Carnegie Mellon University United States of America
application of advanced control
process monitoring
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