Diffusion Characterization Professors in Global

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Alexander Bardelcik
University of Guelph Canada
fracture characterization
micro-mechanical characterization
constitutive characterization
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Markus Becherer
Technical University of Munich Germany
optical characterization
electrical characterization
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Guo-zhen Zhu
University of Manitoba Canada
material characterization
advanced materials characterization
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Emielda Yusiharni
University of Western Australia Australia
material characterization
x-ray diffraction
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Fredrik Langkilde
University of Gothenburg Sweden
tissue characterization
diffusion-weighted imaging
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Siegbert Schmid
University of Sydney Australia
material characterisation
powder diffraction
x-ray diffraction
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Muhammad Afzal
University of New Brunswick Canada
physio-chemical characterization
mechanical characterization
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Hosea Nelson
California Institute of Technology United States of America
material characterization
electron diffraction
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Peter Hedström
KTH Royal Institute of Technology Sweden
diffraction
advanced materials characterization
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Ben Britton
University of British Columbia Canada
materials characterization
electron diffraction
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Ben Britton
University of British Columbia Canada
materials characterization
electron diffraction
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Eric Sigmund
New York University United States of America
diffusion tensor imaging
diffusion-weighted imaging
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Peng Wang
University of Warwick United Kingdom
materials characterization
computational diffractive imaging
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Joanne Etheridge
Monash University Australia
materials characterisation
electron diffraction
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Andrei Sarua
University of Bristol United Kingdom
electro-optical characterization
device characterization
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Oscar Jalnefjord
University of Gothenburg Sweden
diffusion-weighted imaging
tumor characterization
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Donald Maclaren
University of Glasgow United Kingdom
nanostructural characterization
nanometric characterization of materials
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Peter King
Imperial College London United Kingdom
reservoir characterization
percolation theory
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Dorte Jensen
Technical University of Denmark Denmark
microstructural characterization techniques
neutron diffraction
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Jeremy Cockcroft
University College London United Kingdom
x-ray diffraction
neutron diffraction
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John Seddon
Imperial College London United Kingdom
x-ray diffraction
neutron diffraction
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