Processing Characterization Materials Professors in Global

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Henner Kampwerth
University of New South Wales Australia
optical characterization techniques
characterization of solar cell materials
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Richard Chromik
McGill University Canada
materials testing
manufacturing processes
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Joanna Stasiak
University of Cambridge United Kingdom
polymer processing
microstructure characterization
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Tom Coyle
University of Toronto Canada
materials selection
powder processing
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Bert Sluys
Delft University of Technology Netherlands
computational modeling of high-performance materials
materials
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Samia Suliman
Pennsylvania State University United States of America
electrical characterization
materials
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Rainer Waser
RWTH Aachen University Germany
electrical characterization
process technology
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Mihaela Banu
University of Michigan United States of America
materials simulation
manufacturing processes
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Roderick Guthrie
McGill University Canada
materials process engineering
mineral processing
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Philippe Ouzilleau
McGill University Canada
materials process engineering
mineral processing
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Paul Lynch
Penn State Behrend United States of America
materials
manufacturing processes
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Volodymyr Bushlya
Lund University Sweden
tooling materials
manufacturing processes
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Yanxia Qin
Singapore University of Technology and Design Singapore
scholarly document processing
natural language processing
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Peter Hosemann
University of California, Berkeley United States of America
microstructural characterization
materials in extreme environments
manufacturing processes
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Loek Cleophas
Eindhoven University of Technology Belgium
data processing
natural language processing
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Hui Jiang
York University Canada
audio processing
natural language processing
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Vlado Keselj
Dalhousie University Canada
text processing
natural language processing
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Youjiang Wang
Georgia Institute of Technology United States of America
manufacturing processes
characterization of fibers
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Andrei Sarua
University of Bristol United Kingdom
device characterization
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Tee Hui
Singapore University of Technology and Design Singapore
device characterization
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Tee Hui
Singapore University of Technology and Design Singapore
device characterization
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