Semiconductor Metrology Inspection Professors in Global

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Chabum Lee
Texas A&M University United States of America
semiconductor metrology inspection
dynamic system metrology inspection
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David Capson
University of Victoria Canada
inspection
metrology
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Chong Li
University of Glasgow United Kingdom
semiconductor devices
metrology
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Jian-min Zuo
Monash University Australia
semiconductor device metrology
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Yuxuan Zhang
Technical University of Denmark Denmark
semiconductor imaging
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Deyi Xue
University of Calgary Canada
machining inspection
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Jize Yan
University of Southampton United Kingdom
monitoring metrology
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Bas Vermulst
Eindhoven University of Technology Belgium
semiconductor lithography
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Mehran Mehrandezh
University of Regina Canada
inspection
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Chang-hyun Kim
University of Ottawa Canada
semiconductor manufacturing
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Lei Zhang
University of Regina Canada
pipeline inspection
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Martin Green
University of New South Wales Australia
semiconductor device modelling
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Jan Ten Thije Boonkkamp
Eindhoven University of Technology Belgium
semiconductor simulation
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Thomas Kailath
Stanford University United States of America
semiconductor manufacturing
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Amir Rashid
KTH Royal Institute of Technology Sweden
manufacturing metrology
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Kameshwar Poolla
University of California, Berkeley United States of America
semiconductor manufacturing
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Mats Bejhem
KTH Royal Institute of Technology Sweden
manufacturing metrology
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Arnold Chen
Purdue University United States of America
semiconductor manufacturing
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Ala Moradian
University of California, Berkeley United States of America
semiconductor manufacturing
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Jarek Antoszewski
University of Western Australia Australia
semiconductor materials characterization
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Benjamin Klein
Georgia Institute of Technology United States of America
semiconductor radiation detectors
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