Semiconductor Materials Characterization Professors in Global

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David Leadley
University of Warwick United Kingdom
electronic properties of semiconductors
optical properties of semiconductors
semiconductor heterostructures
low dimensional semiconductor structures
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Martin Green
University of New South Wales Australia
semiconductor device modelling
semiconductor device physics
photovoltaic device fabrication and characterisation
novel semiconductor devices
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Abdallah Ougazzaden
Georgia Institute of Technology United States of America
materials characterizations
iii-v semiconductor device physics
nitride-based semiconductor materials
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Jian-min Zuo
Monash University Australia
semiconductor device metrology
thin-films nanostructures characterization
machine learning applications in materials characterization
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David Dixon
University of British Columbia Canada
materials characterization
materials properties
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Guo-zhen Zhu
University of Manitoba Canada
material characterization
advanced materials characterization
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Badrinath Veluri
Aarhus University Denmark
material characterization
semiconductor physics
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Marcel Verheijen
Eindhoven University of Technology Belgium
materials characterization
high resolution tem characterization
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Arnab Banerjee
Purdue University United States of America
material characterization
quantum properties of materials
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Wayne Lau
University of Michigan United States of America
optical properties of semiconductors
semiconductor nanostructures
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Lionel Kimerling
Massachusetts Institute of Technology United States of America
semiconductor materials
semiconductor devices
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Um Aryal
University of Southern Denmark Denmark
surface material characterization
semiconductor physics
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James Shealy
Cornell University Netherlands
compound semiconductor materials
semiconductor physics
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R. Van Dover
Cornell University Netherlands
characterization of nanometer-scale materials
synthesis and characterization of novel optical materials
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Tomasz Kowalewski
Carnegie Mellon University United States of America
characterization of nanostructures
device fabrication and characterization
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Richard Newbury
University of New South Wales Australia
electronic properties of semiconductor structures
low dimensional semiconductor systems
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Carlos Larriba-andaluz
Purdue University United States of America
polymer characterization
protein biomolecule characterization
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Stephanie Law
Pennsylvania State University United States of America
semiconductor materials
optoelectronic properties
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Teng Lu
Australian National University Australia
optical properties characterization
electrical mechanical properties characterization
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Donald Maclaren
University of Glasgow United Kingdom
nanometric characterization of materials
nanostructural characterization
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Noa Marom
Carnegie Mellon University United States of America
semiconductor materials
computational materials
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