Device Defect Modeling Professors in Global

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Lei Feng
KTH Royal Institute of Technology Sweden
modeling
model-based design
model checking
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Kishor Trivedi
Duke University Singapore
reliability modeling
availability modeling
performability modeling
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Scott Roy
University of Glasgow United Kingdom
device modelling
device scaling
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Sumeet Gupta
Purdue University United States of America
device-circuit modeling
device-circuit co-design
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Tee Hui
Singapore University of Technology and Design Singapore
device characterization
modeling
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Tee Hui
Singapore University of Technology and Design Singapore
device characterization
modeling
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Um Aryal
University of Southern Denmark Denmark
device fabrication
device physics engineering
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Duncan Walker
Texas A&M University United States of America
defect-based test
realistic fault modeling
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Hao Zhang
University of Alberta Canada
defects in materials
modelling
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Robert Dutton
Stanford University United States of America
device analysis
process modeling
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George Milne
University of Western Australia Australia
disease modeling
simulation modeling
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Jan Grahn
Chalmers University of Technology Sweden
device physics
electrical modelling
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Iain Moyles
York University Canada
disease modelling
behaviour modelling
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Devendra Garg
Duke University Singapore
sensor modeling
modeling
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Maria Rodriguez
Uppsala University Sweden
problem modelling
constraint modelling
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Jan Karlshøj
Technical University of Denmark Denmark
data modeling
process modeling
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Mohamed Nounou
Texas A&M University United States of America
fault detection
process modeling
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Thomas Edgar
University of Texas at Austin United States of America
modeling
fault detection
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Saibal Mukhopadhyay
Georgia Institute of Technology United States of America
device
circuit level modeling
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Shirley Tang
University of Waterloo Canada
modeling
devices
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Salvador Garcia Muñoz
Carnegie Mellon University United States of America
dynamic modeling
fault detection
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