Device Defect Modeling Professors in Global

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Sumeet Gupta
Purdue University United States of America
device-circuit modeling
device-circuit co-design
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Maria Rodriguez
Uppsala University Sweden
problem modelling
constraint modelling
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Miroslaw Staron
Chalmers University of Technology Sweden
predicting defect inflow
model driven software development
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Jan Karlshøj
Technical University of Denmark Denmark
data modeling
process modeling
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Andrea Ferrari
University of Cambridge United Kingdom
modeling
devices
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Shirley Tang
University of Waterloo Canada
modeling
devices
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Tobias Breiten
Technical University of Berlin Germany
modeling
model reduction
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Gary Stephen
Georgia Institute of Technology United States of America
modeling
devices monitoring
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Lei Feng
KTH Royal Institute of Technology Sweden
modeling
model-based design
model checking
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Paul Johannesson
Stockholm University Sweden
process modeling
information systems modeling
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Pascal Etman
Eindhoven University of Technology Belgium
model-based design optimization
design structure matrix modeling
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Carsten Svaneborg
University of Southern Denmark Denmark
molecular modelling
computer models development
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Yuming Guo
Monash University Australia
infectious disease modeling
remote sensing modeling
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Kishor Trivedi
Duke University Singapore
reliability modeling
availability modeling
performability modeling
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Moritz Fieback
Delft University of Technology Netherlands
device defect modeling
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Chenming Hu
University of California, Berkeley United States of America
semiconductor device modeling
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Mahmoud Mousavi
Uppsala University Sweden
defect mechanics
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Blaise Bourdin
McMaster University Canada
defect mechanics
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Akke Suiker
Eindhoven University of Technology Belgium
failure modeling
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Susanne Mirbt
Uppsala University Sweden
semiconductor defects
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Helm Jansen
Eindhoven University of Technology Belgium
modeling of electromechanical devices
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