Microstructural Characterization Of Materials Professors in Global

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Shefford Baker
Cornell University Netherlands
microstructural characterization
mechanical properties of materials
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Peng Wang
University of Warwick United Kingdom
materials characterization
machine learning in microscopy
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Sergei Kazarian
Imperial College London United Kingdom
materials characterization
nanostructured materials
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Hao Zhang
University of Alberta Canada
materials characterization
nanostructured materials
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David Dixon
University of British Columbia Canada
materials characterization
materials properties
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Somnath Ghosh
Johns Hopkins University United States of America
materials characterization
structure-materials modeling simulations
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Maria Charalambides
Imperial College London United Kingdom
material modeling
mechanical characterization
micromechanics
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Muhammad Afzal
University of New Brunswick Canada
mechanical characterization
physio-chemical characterization
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Afsaneh Edrisy
University of Windsor Canada
mechanical characterization of thin films
microstructures and mechanical properties relationship
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Gary Fedder
Carnegie Mellon University United States of America
microfabrication
microsystems
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Luc Fréchette
University of Sherbrooke Canada
microfabrication
microsystems
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Wilbur Lam
Georgia Institute of Technology United States of America
microfabrication
microtechnology
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Klas Hjort
Uppsala University Sweden
micromechanics
microsystems
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Johan Hoefnagels
Eindhoven University of Technology Belgium
microscopic characterization
micromechanics
micro-mechanical testing
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Valdemar Bille-lauridsen
Technical University of Denmark Denmark
experimental characterization
nanostructures
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Laurence Brassart
University of Oxford United Kingdom
micromechanics
constitutive modelling of rubberlike materials
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Vito Tagarielli
Imperial College London United Kingdom
micromechanics
constitutive modelling of engineering materials
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Carl Thompson
Massachusetts Institute of Technology United States of America
microsystems
nanostructures
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Katsuyo Thornton
University of Michigan United States of America
microstructures
nanostructures
computational material science
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Ralph Spolenak
ETH Zurich Switzerland
physical properties of materials
mechanical properties of materials
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Andrei Sarua
University of Bristol United Kingdom
electro-optical characterization
device characterization
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