Semiconductor Device Reliability Professors in Global

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Francesco Iannuzzo
Aalborg University Denmark
power device reliability
reliability of power electronics
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Mottaqiallah Taouil
Delft University of Technology Netherlands
hardware dependability
reliability
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Kishor Trivedi
Duke University Singapore
software reliability
reliability engineering
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Gilberto Umana Membreno
University of Western Australia Australia
reliability
semiconductor device physics
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Kishor Trivedi
Duke University Singapore
software reliability
reliability modeling
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Nagarajan Raghavan
Singapore University of Technology and Design Singapore
reliability
reliability-based design
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George Shanthikumar
Purdue University United States of America
reliability
semiconductor yield management
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J.george Shanthikumar
Purdue University United States of America
reliability
semiconductor yield management
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Ariya Sangwongwanich
Aalborg University Denmark
reliability
sustainability in power electronics
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Lionel Kimerling
Massachusetts Institute of Technology United States of America
semiconductor devices
semiconductor materials
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Baran Yeter
Aalborg University Denmark
structural reliability
management reliability
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Rania Al-hammoud
University of Waterloo Canada
reliability
durability
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Rania Al-hammoud
University of Waterloo Canada
reliability
durability
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Kostas Kopsidas
University of Manchester United Kingdom
operation reliability
reliability assessment
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Yasmine Abdin
University of British Columbia Canada
structural reliability
durability
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Yasmine Abdin
University of British Columbia Canada
structural reliability
durability
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Ryan O’neil
Concordia University Canada
reliability engineering
system resilience
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Nagarajan Raghavan
Singapore University of Technology and Design Singapore
reliability quality control
reliability-based design
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Sam Pagliarini
Carnegie Mellon University United States of America
trustworthy integrated circuit design
secure chip systems
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Caterina Natali
Technical University of Denmark Denmark
electronics reliability
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Said Hamdioui
Delft University of Technology Netherlands
hardware dependability
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