Integrated Circuit Test Professors in Global

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Hossein Hashemi
University of Southern California United States of America
microwave integrated circuits
radio frequency integrated circuits
photonic integrated circuits
millimeter-wave integrated circuits
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Ali Hajimiri
California Institute of Technology United States of America
integrated circuit
integrated radar
millimeter-wave integrated circuits
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Ali Hajimiri
California Institute of Technology United States of America
integrated circuits
integrated radar
millimeter-wave integrated circuits
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Flemming Stassen
Technical University of Denmark Denmark
integrated circuits
testing
fault-tolerant circuits
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Kamal El-sankary
Dalhousie University Canada
digital integrated circuits
mixed-signal integrated circuits
analog integrated circuits
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Shaolan Li
Georgia Institute of Technology United States of America
mixed-signal integrated circuits
analog integrated circuits
rf integrated circuits
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Shiwei Wang
University of Edinburgh United Kingdom
integrated circuits
integrated neuro-electronics
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Wooram Lee
Pennsylvania State University United States of America
integrated circuit systems
high-frequency integrated circuits
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Irith Pomeranz
Purdue University United States of America
integrated circuits
built-in self-test
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Robert Darling
University of Washington United States of America
integrated circuit design
integrated sensor development
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Jie Han
University of Alberta Canada
integrated circuits
fault-tolerant circuits
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Jiayang Li
University of Bristol United Kingdom
integrated circuit design
mixed-signal integrated circuits
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Carl Thompson
Massachusetts Institute of Technology United States of America
integrated circuits
integrated thin film batteries
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Thomas Kenny
Stanford University United States of America
integrated circuit fabrication
infrared detectors
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Clark Nguyen
University of California, Berkeley United States of America
integrated circuit design technology
integrated micromechanical signal processors
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Hossein Naghavi
University of Washington United States of America
integrated quantum systems
terahertz integrated circuits
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Jason Woo
University of California Los Angeles United States of America
modeling integrated circuits
circuit optimization
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Robert Feeney
Georgia Institute of Technology United States of America
circuit analysis
microwave integrated circuits
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Ben Jar
University of Alberta Canada
impact testing
material testing
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Friedel Gerfers
Technical University of Berlin Germany
high-speed integrated circuits
automotive integrated circuits
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Vadim Geurkov
Toronto Metropolitan University Canada
built-in self-test
digital mixed-signal systems testing
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