Testing Integrated Circuits Professors in Global

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Ali Hajimiri
California Institute of Technology United States of America
integrated circuits
terahertz silicon integrated circuits
millimeter-wave integrated circuits
integrated radar
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Ali Hajimiri
California Institute of Technology United States of America
integrated circuit
terahertz silicon integrated circuits
millimeter-wave integrated circuits
integrated radar
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Hossein Hashemi
University of Southern California United States of America
microwave integrated circuits
radio frequency integrated circuits
photonic integrated circuits
millimeter-wave integrated circuits
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Flemming Stassen
Technical University of Denmark Denmark
integrated circuits
testing
fault-tolerant circuits
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Paul Brostean
Uppsala University Sweden
security testing
software testing
network protocol testing
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Kamal El-sankary
Dalhousie University Canada
digital integrated circuits
mixed-signal integrated circuits
analog integrated circuits
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Shadi Balawi
Texas A&M University United States of America
experimental testing
static testing
dynamic testing
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Robert Feeney
Georgia Institute of Technology United States of America
circuit analysis
microwave integrated circuits
circuit design
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Sigrid Eldh
Carleton University Canada
software testing
test automation
test technologies
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Vadim Geurkov
Toronto Metropolitan University Canada
digital mixed-signal systems testing
built-in self-test
testable design
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Shaolan Li
Georgia Institute of Technology United States of America
mixed-signal integrated circuits
analog integrated circuits
rf integrated circuits
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Wooram Lee
Pennsylvania State University United States of America
integrated circuit systems
high-frequency integrated circuits
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Irith Pomeranz
Purdue University United States of America
integrated circuits
built-in self-test
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Jie Han
University of Alberta Canada
integrated circuits
fault-tolerant circuits
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Eugenio Cantatore
Eindhoven University of Technology Belgium
integrated circuits
electronic circuits
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Ronald Blanton
Carnegie Mellon University United States of America
integrated system testing
testable design
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Robert Darling
University of Washington United States of America
integrated circuit design
integrated sensor development
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Farid Najm
University of Toronto Canada
integrated circuits
electronic circuits
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Shiwei Wang
University of Edinburgh United Kingdom
integrated circuits
integrated neuro-electronics
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Andreas Burg
École Polytechnique Fédérale de Lausanne Switzerland
integrated circuits
image processing circuits
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Jiayang Li
University of Bristol United Kingdom
integrated circuit design
mixed-signal integrated circuits
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